Diffraction and imaging techniques in material science
General Material Designation
[Book]
First Statement of Responsibility
editors, S. Amelinckx, R. Gevers, J. Van Landuyt.
EDITION STATEMENT
Edition Statement
2d, rev. ed.
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
New York :
Name of Publisher, Distributor, etc.
Sole distributors for the U.S.A. and Canada, Elsevier North-Holland,
Date of Publication, Distribution, etc.
1978.
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
1 online resource (2 v. (xvii, 847 p., [1] folded leaf of plates)) :
Other Physical Details
ill.
GENERAL NOTES
Text of Note
Comprises new contributions and revised and updated papers originally presented at the International Summer Course on Material Science, Antwerp, 1969, and published in 1970 under title: Modern diffraction and imaging techniques in material science.
INTERNAL BIBLIOGRAPHIES/INDEXES NOTE
Text of Note
Includes bibliographical references and index.
CONTENTS NOTE
Text of Note
v. 1. Electron microscopy.--v. 2. Imaging and diffraction techniques.
0
TOPICAL NAME USED AS SUBJECT
Electron microscopy, Congresses.
Electrons-- Diffraction, Congresses.
Imaging systems, Congresses.
Afbeeldingen (algemeen)
Elektronenmicroscopie.
MICROSCÓPIO ELETRÔNICO (CONGRESSOS)
OTHER CLASS NUMBERS
Class number
33
.
61
System Code
bcl
PERSONAL NAME - ALTERNATIVE RESPONSIBILITY
Amelinckx, S., (Severin)
Gevers, R.
Landuyt, J. van.
CORPORATE BODY NAME - ALTERNATIVE RESPONSIBILITY
International Summer Course on Material Science(1969 :, Antwerp, Belgium).