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ورود / ثبت نام
عنوان
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
پدید آورنده
\ Andrei Pavlov, Manoj Sachdev
موضوع
Metal oxide semiconductors, Complementary -- Design. ,Random access memory.,نیمه هادیهای اکسید فلزی مکمل -- طراحی ,حافظه دسترسی تصادفی
رده
E-Book
,
کتابخانه
Library of Foreign Languages and Islamic Sources
محل استقرار
استان:
Qom
ـ شهر:
Qom
تماس با کتابخانه :
37839111
INTERNATIONAL STANDARD BOOK NUMBER
(Number (ISBN
:9781402083624
NATIONAL BIBLIOGRAPHY NUMBER
Number
42357
LANGUAGE OF THE ITEM
.Language of Text, Soundtrack etc
انگلیسی
TITLE AND STATEMENT OF RESPONSIBILITY
Title Proper
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
General Material Designation
[Electronic book]
Other Title Information
: Process-Aware SRAM Design and Test
First Statement of Responsibility
\ Andrei Pavlov, Manoj Sachdev
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
[Dordrecht]
Name of Publisher, Distributor, etc.
: Springer
Date of Publication, Distribution, etc.
, 2008
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
xvi, 193 p
Other Physical Details
:ill
SERIES
Series Title
Frontiers in electronic testing
Volume Designation
; 40
INTERNAL BIBLIOGRAPHIES/INDEXES NOTE
Text of Note
Index
Text of Note
Bibliography
TOPICAL NAME USED AS SUBJECT
Metal oxide semiconductors, Complementary -- Design.
Random access memory.
نیمه هادیهای اکسید فلزی مکمل -- طراحی
حافظه دسترسی تصادفی
LIBRARY OF CONGRESS CLASSIFICATION
E-Book
,
PERSONAL NAME - PRIMARY RESPONSIBILITY
Pavlov, Andrei
PERSONAL NAME - ALTERNATIVE RESPONSIBILITY
Sachdev, Manoj
ELECTRONIC LOCATION AND ACCESS
Date and Hour of Consultation and Access
9781402083624.pdf
BL
278840
1
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