Recent developments in thin film research :epitaxial growth and nanostructures, electron microscopy, and x-ray diffraction : proceedings of Symposium B on Epitaxial Thin Film Growth and Nanostructures and proceedings of Symposium C on Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures of the 1997 ICAM/E-MRS Spring Conference, Strasbourg, France, June 16-20, 1997
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Amsterdam ; New York
Name of Publisher, Distributor, etc.
Elsevier
Date of Publication, Distribution, etc.
c1997
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
x, 279, v, 223 p. :ill. ;29 cm
SERIES
Series Title
European Materials Research Society symposia proceedings
ISSN of Series
69
GENERAL NOTES
Text of Note
"Reprinted from Thin solid films, vol. 318 )1-2( and Thin solid films, vol. 319 )1-2("--T.p. verso.
Text of Note
Includes bibliographical references and indexes.
NOTES PERTAINING TO TITLE AND STATEMENT OF RESPONSIBILITY
Text of Note
]G. Ritter ... et al., editors[
TOPICAL NAME USED AS SUBJECT
Entry Element
، Thin films
Entry Element
، Epitaxy
Entry Element
، Nanostructured materials
Entry Element
، Electron microscopy
Entry Element
Diffraction ، X-rays
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TA
418
.
9
.
T45
S94
1997
PERSONAL NAME - PRIMARY RESPONSIBILITY
Relator Code
AU
AU .G ,rettiR ed.
CO Symposium C on Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures)7991 :Strasbourg, France(
TI
SE
CORPORATE BODY NAME - SECONDARY RESPONSIBILITY
Entry Element
Symposium B on Epitaxial Thin Film Growth and Nanostructures)1997 : Strasbourg, France(