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عنوان
2000 IEEE International Workshop on Defect Based Testing, April 30, 2000, Montreal, Canada
پدید آورنده
sponsored by IEEE Computer Society Test Technology Technical Committee; edited by Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon
موضوع
Testing -- Congresses ، Metal oxide semiconductors, Complementary,Congresses ، Iddq testing,Defects -- Congresses ، Integrated circuits
رده
TK
7871
.
99
.
M44
2000
کتابخانه
Central Library and Information Center of Ferdowsi University of Mashhad
محل استقرار
استان:
Khorasan Razavi
ـ شهر:
Mashhad
تماس با کتابخانه :
05138806503
OTHER STANDARD IDENTIFIER
Standard Number
22935
TITLE AND STATEMENT OF RESPONSIBILITY
Title Proper
2000 IEEE International Workshop on Defect Based Testing, April 30, 2000, Montreal, Canada
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Washington
Name of Publisher, Distributor, etc.
IEEE Computer Society
Date of Publication, Distribution, etc.
c2000
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
ix, 82p.: ill
GENERAL NOTES
Text of Note
"The workshop has been renamed from 'Iddq Testing' to 'DBT" - P. vii
Text of Note
"IEEE Computer Society Order Number PR00637" - T.p. verso
Text of Note
"IEEE order plan catalog number PR00637" - T.p. verso
Text of Note
Online version also available to IEEE Xplore subscribers
Text of Note
Includes bibliographical references and index
NOTES PERTAINING TO TITLE AND STATEMENT OF RESPONSIBILITY
Text of Note
sponsored by IEEE Computer Society Test Technology Technical Committee; edited by Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon
TOPICAL NAME USED AS SUBJECT
Entry Element
Testing -- Congresses ، Metal oxide semiconductors, Complementary
Entry Element
Congresses ، Iddq testing
Entry Element
Defects -- Congresses ، Integrated circuits
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK
7871
.
99
.
M44
2000
PERSONAL NAME - PRIMARY RESPONSIBILITY
Relator Code
AU
AU Malaiya, Yashwant K.
AU Sachdev, Manoj
AU Menon, Sankaran M.
TI
CORPORATE BODY NAME - SECONDARY RESPONSIBILITY
Entry Element
IEEE International Workshop on Defect Based Testing )2000: Montreal(
LOCATION AND CALL NUMBER
Call Number Suffix
CL
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