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عنوان
Reliability and degradation

پدید آورنده
edited by M.J. Howes D.V. Morgan

موضوع
Semiconductors - Reliability

رده
TK
7871
.
85
.
R44
1981

کتابخانه
Central Library and Information Center of Ferdowsi University of Mashhad

محل استقرار
استان: Khorasan Razavi ـ شهر: Mashhad

Central Library and Information Center of Ferdowsi University of Mashhad

تماس با کتابخانه : 05138806503

OTHER STANDARD IDENTIFIER

Standard Number
7099

TITLE AND STATEMENT OF RESPONSIBILITY

Title Proper
Reliability and degradation

.PUBLICATION, DISTRIBUTION, ETC

Place of Publication, Distribution, etc.
Chichester, New York
Name of Publisher, Distributor, etc.
Wiley
Date of Publication, Distribution, etc.
1981

PHYSICAL DESCRIPTION

Specific Material Designation and Extent of Item
xii, 444p.:ill

SERIES

Series Title
The Wiley series in solid state devices and circuits

GENERAL NOTES

Text of Note
Includes bibliographical references and index

NOTES PERTAINING TO TITLE AND STATEMENT OF RESPONSIBILITY

Text of Note
edited by M.J. Howes D.V. Morgan

TOPICAL NAME USED AS SUBJECT

Entry Element
Semiconductors - Reliability

LIBRARY OF CONGRESS CLASSIFICATION

Class number
TK
7871
.
85
.
R44
1981

PERSONAL NAME - PRIMARY RESPONSIBILITY

Relator Code
TI

TI Howes, M.J
AU Morgan, D.V
SE

LOCATION AND CALL NUMBER

Call Number Suffix
CL

Proposal/Bug Report

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