Nondestructive evaluation of semiconductor materials and devices: )lectured presented at the NATO advanced Study Institute on Nondestructive Evaluation of Semiconductor Materials and Devices, held at the Villa Tuscolano, Italy, September 19-29, 1978
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
New York
Name of Publisher, Distributor, etc.
Raven Press
Date of Publication, Distribution, etc.
c1979
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
xi, 782p.:ill
SERIES
Series Title
NATO advanced study institutes series B, physics; v.64
GENERAL NOTES
Text of Note
Includes bibliographical references and index
Text of Note
"Published in Cooperation With NATO Scientific Affairs Division"
NOTES PERTAINING TO TITLE AND STATEMENT OF RESPONSIBILITY
Text of Note
edited by Jay N. Zemel
TOPICAL NAME USED AS SUBJECT
Entry Element
Semiconductors - Testing - Congresses
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK
7871
.
85
.
N376
1978
PERSONAL NAME - PRIMARY RESPONSIBILITY
Relator Code
AU
AU Zemel, Jay N
CO North Atlantic Treaty Organization. Division of Scientific Affairs
TI
SE
CORPORATE BODY NAME - SECONDARY RESPONSIBILITY
Entry Element
Nato Advanced Study Institute on Nondestructive Evaluation of Semiconductor Materials and Devices, Villa Tuscolano, Italy, 1978