عنوان
پدید آورنده
موضوع
رده
TK 7871.99 .M44 S23 2007
TK
7871
.
99
.
M44
S23
2007
کتابخانه
محل استقرار
OTHER STANDARD IDENTIFIER
Standard Number
3151
TITLE AND STATEMENT OF RESPONSIBILITY
First Statement of Responsibility
Sachdev, Manoj.
Title Proper
Defect oriented testing for nano metric CMOS vlsi circuits
.PUBLICATION, DISTRIBUTION, ETC
Name of Publisher, Distributor, etc.
springer
Date of Publication, Distribution, etc.
2007
GENERAL NOTES
Text of Note
ISBN: 0387465464 9780387465463 0387465472 9780387465470
Text of Note
Includes bibliographical references and index.
Text of Note
ng
NOTES PERTAINING TO TITLE AND STATEMENT OF RESPONSIBILITY
Text of Note
by Manoj Sachdev
TOPICAL NAME USED AS SUBJECT
Entry Element
، Metal oxide semiconductors, Complementary- Testing
Entry Element
، Metal oxide semiconductors, Complementary- Defects
DEWEY DECIMAL CLASSIFICATION
Number
box1
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK
7871
.
99
.
M44
S23
2007
PERSONAL NAME - PRIMARY RESPONSIBILITY
Relator Code
AU
TI
LOCATION AND CALL NUMBER
Call Number Suffix
1
