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ورود / ثبت نام
عنوان
Testing and reliable design of CMOS circuits
پدید آورنده
Jha, Niraj K.
موضوع
، Metal oxide semiconductors, Complimentary- Testing,، Metal oxide semiconductors, Complimentary- Reliability,، Integrated circuits- Very large scale integration- Design and construction
رده
کتابخانه
Library of Niroo Research Institue
محل استقرار
استان:
Tehran
ـ شهر:
Tehran
تماس با کتابخانه :
9
-
88079401
-
021
OTHER STANDARD IDENTIFIER
Standard Number
4694
TITLE AND STATEMENT OF RESPONSIBILITY
First Statement of Responsibility
Jha, Niraj K.
Title Proper
Testing and reliable design of CMOS circuits
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Boston
Name of Publisher, Distributor, etc.
Kluwer Academic Publishers
Date of Publication, Distribution, etc.
c1990
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
xii, 231 p. :ill. ;25 cm
SERIES
Series Title
Kluwer international series in engineering and computer science ; SECS 88.
ISSN of Series
VLSI, computer architecture, and digital signal processing
GENERAL NOTES
Text of Note
Includes bibliographical references.
TOPICAL NAME USED AS SUBJECT
Entry Element
، Metal oxide semiconductors, Complimentary- Testing
Entry Element
، Metal oxide semiconductors, Complimentary- Reliability
Entry Element
، Integrated circuits- Very large scale integration- Design and construction
DEWEY DECIMAL CLASSIFICATION
Number
621
.
39/732
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK
7871
.
99
.
M44J49
1990
PERSONAL NAME - PRIMARY RESPONSIBILITY
Relator Code
AU
Entry Element
by Niraj K. Jha. and Sandip Kundu
AU .pidnaS ,udnuK
TI
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