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ورود / ثبت نام
عنوان
Ionizing radiation effects in MOS devices and circuits
پدید آورنده
موضوع
، Metal oxide semiconductors- Effect of radiation on
رده
کتابخانه
Library of Niroo Research Institue
محل استقرار
استان:
Tehran
ـ شهر:
Tehran
تماس با کتابخانه :
9
-
88079401
-
021
OTHER STANDARD IDENTIFIER
Standard Number
7157
TITLE AND STATEMENT OF RESPONSIBILITY
Title Proper
Ionizing radiation effects in MOS devices and circuits
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
New York
Name of Publisher, Distributor, etc.
Wiley
Date of Publication, Distribution, etc.
1989
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
xviii, 587 p. :ill. ;25 cm
GENERAL NOTES
Text of Note
"A Wiley- Interscience publication."
Text of Note
Includes bibliographical references.
Text of Note
ALSO E-BOOK
TOPICAL NAME USED AS SUBJECT
Entry Element
، Metal oxide semiconductors- Effect of radiation on
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK
7871
.
99
.
M44I56
1989
PERSONAL NAME - PRIMARY RESPONSIBILITY
Relator Code
TI
Entry Element
edited by T.P. Ma and Paul V. Dressendorfer
AU .P .T ,aM
AU .V luaP ,refrodnesserD
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