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An artificial intelligence approach to test generation
پدید آورنده
Singh, Narinder, 6591-
موضوع
، Integrated circuits- Very large scale integration- Testing- Data processing,، Expert systems )Computer science(,، Artificial intelligence
رده
کتابخانه
Library of Niroo Research Institue
محل استقرار
استان:
Tehran
ـ شهر:
Tehran
تماس با کتابخانه :
9
-
88079401
-
021
OTHER STANDARD IDENTIFIER
Standard Number
4637
TITLE AND STATEMENT OF RESPONSIBILITY
First Statement of Responsibility
Singh, Narinder, 6591-
Title Proper
An artificial intelligence approach to test generation
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Boston
Name of Publisher, Distributor, etc.
Kluwer Academic Publishers
Date of Publication, Distribution, etc.
c1987
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
x, 193 p. :ill. ;25 cm
SERIES
Series Title
The Kluwer international series in engineering and computer science ; SECS 91
GENERAL NOTES
Text of Note
Bibliography: p. ]189[- 193.
TOPICAL NAME USED AS SUBJECT
Entry Element
، Integrated circuits- Very large scale integration- Testing- Data processing
Entry Element
، Expert systems )Computer science(
Entry Element
، Artificial intelligence
DEWEY DECIMAL CLASSIFICATION
Number
621
.
395
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK
7874
.
S533
1987
PERSONAL NAME - PRIMARY RESPONSIBILITY
Relator Code
AU
Entry Element
by Narinder Singh
TI
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