عنوان
پدید آورنده
موضوع
رده
TK 7870 .25 .L35 1997
TK
7870
.
25
.
L35
1997
کتابخانه
محل استقرار
OTHER STANDARD IDENTIFIER
Standard Number
118603
LANGUAGE OF THE ITEM
.Language of Text, Soundtrack etc
پائیز۸۷
.Language of Text, Soundtrack etc
English
TITLE AND STATEMENT OF RESPONSIBILITY
General Material Designation
)50(
First Statement of Responsibility
Lall, Pradeep
Title Proper
Influence of temperature on microelectronics and system reliability
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Boca Raton
Name of Publisher, Distributor, etc.
CRC Press
Date of Publication, Distribution, etc.
1997
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
307 p.: ill.; 26 cm
GENERAL NOTES
Text of Note
Includes bibliographical references and index
TOPICAL NAME USED AS SUBJECT
Entry Element
، Microelectronics-- Materials-- Thermal properties
Entry Element
، Electronic packaging
Entry Element
، Elctronic apparatus and appliances-- Reliability
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK
7870
.
25
.
L35
1997
PERSONAL NAME - PRIMARY RESPONSIBILITY
Relator Code
AU
Entry Element
Pradeep Lall, Michael G. Pecht, Edward B. Hakim
AU .G leahciM ,thceP
AU .B drawdE ,mikaH
TI
LOCATION AND CALL NUMBER
Shelving Form of Title, Author, Author/Title
05
