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عنوان
Proceedings
پدید آورنده
International Test Conference
موضوع
، Computer storage devices-- Congresses,، Integrated circuits-- Testing-- Congresses,، Semiconductor storage devices-- Testing-- Congresses
رده
TK
7874
.
I474
کتابخانه
Central Library of Sharif University of Technology
محل استقرار
استان:
Tehran
ـ شهر:
Tehran
تماس با کتابخانه :
66005817
-
021
OTHER STANDARD IDENTIFIER
Standard Number
109770
Standard Number
114766
Standard Number
115641
LANGUAGE OF THE ITEM
.Language of Text, Soundtrack etc
پائیز۷۷
.Language of Text, Soundtrack etc
English
TITLE AND STATEMENT OF RESPONSIBILITY
General Material Designation
)50-91(
First Statement of Responsibility
International Test Conference
Title Proper
Proceedings
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Silver Spring, Md.
Name of Publisher, Distributor, etc.
IEEE Computer Society Press
Date of Publication, Distribution, etc.
1983-
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
v. : ill. ; 28 cm
GENERAL NOTES
Text of Note
Annual
Text of Note
Some conferences also have distinctive titles
Text of Note
Published: Altoona, PA: International Test Conference, )1995-(
Text of Note
Sponsored by the IEEE Computer Society, Test Technology Committee, and the IEEE, Philadelphia Section
Text of Note
Cover title: IEEE ... Test Conference 1983-1986
Text of Note
Cover title: IEEE International Test Conference 1987-
Text of Note
Continues:International Test Conference. Digest of papers, ISSN 0743-1686
Text of Note
ISSN 1089-3539= Proceedings- International Test Conference
TOPICAL NAME USED AS SUBJECT
Entry Element
، Computer storage devices-- Congresses
Entry Element
، Integrated circuits-- Testing-- Congresses
Entry Element
، Semiconductor storage devices-- Testing-- Congresses
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK
7874
.
I474
PERSONAL NAME - PRIMARY RESPONSIBILITY
Relator Code
AU
Entry Element
International Test Conference
CO IEEE Computer Society. Test Technology Committee
CO Institute of Electrical and Electronics Engineers. Philadelphia Section
TI
TI IEEE... Test Conference
TI IEEE International Test Conference
LOCATION AND CALL NUMBER
Shelving Form of Title, Author, Author/Title
129
Shelving Form of Title, Author, Author/Title
05
Shelving Form of Title, Author, Author/Title
129
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