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عنوان
Testability concepts for digital ICs : the macro test approach
پدید آورنده
Beenker, F. P. M.)Frans P. M.(
موضوع
، Digital integrated circuits-- Testing,، Automatic checkout equipment
رده
TK
7874
.
65
.
B44
1996
کتابخانه
Central Library of Sharif University of Technology
محل استقرار
استان:
Tehran
ـ شهر:
Tehran
تماس با کتابخانه :
66005817
-
021
OTHER STANDARD IDENTIFIER
Standard Number
115634
Standard Number
122170
LANGUAGE OF THE ITEM
.Language of Text, Soundtrack etc
تابستان۷۷
.Language of Text, Soundtrack etc
English
TITLE AND STATEMENT OF RESPONSIBILITY
General Material Designation
)50-91(
First Statement of Responsibility
Beenker, F. P. M.)Frans P. M.(
Title Proper
Testability concepts for digital ICs : the macro test approach
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Dordrecht
Name of Publisher, Distributor, etc.
Kluwer Academic Publishers
Date of Publication, Distribution, etc.
1995
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
ix, 212 p. : ill. ; 25 cm
SERIES
Series Title
Frontiers in electronic testing
GENERAL NOTES
Text of Note
Includes bibliographical references
TOPICAL NAME USED AS SUBJECT
Entry Element
، Digital integrated circuits-- Testing
Entry Element
، Automatic checkout equipment
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK
7874
.
65
.
B44
1996
PERSONAL NAME - PRIMARY RESPONSIBILITY
Relator Code
AU
Entry Element
by F.P.M. Beenker, R.G. Bennetts, A.P. Thijssen
AU .G .R ,sttenneB
AU .P .A ,nessjihT
TI
LOCATION AND CALL NUMBER
Shelving Form of Title, Author, Author/Title
129
Shelving Form of Title, Author, Author/Title
05
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