Designing, testing, and diagnostics--join them : International Test Conference 1993 proceedings :October 17-21, 1993, Convention Center, Baltimore, Maryland, USA
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Altoona, PA
Name of Publisher, Distributor, etc.
The Conference
Date of Publication, Distribution, etc.
1993
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
xii, 1065 p. : ill. ; 29 cm
GENERAL NOTES
Text of Note
Cover title
Text of Note
IEEE Computer Society Press order number 4192-02--P. ii
Text of Note
Includes bibliographical references and index
TOPICAL NAME USED AS SUBJECT
Entry Element
، Integrated circuits-- Testing-- Congresses
Entry Element
، Automatic checkout equipment-- Congresses
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK
7874
.
I474
1993
PERSONAL NAME - PRIMARY RESPONSIBILITY
Relator Code
AU
Entry Element
sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section
CO IEEE Computer Society, Test Technology Technical Committee
CO Institute of Electrical and Electronics Engineers, Philadelphia Section
TI
CORPORATE BODY NAME - SECONDARY RESPONSIBILITY
Entry Element
International Test Conference )1993: Baltimore, Md.(