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عنوان
An artificial intelligence approach to test generation
پدید آورنده
Singh, Narinder
موضوع
$AIntegrated circuits - Very large scale integration - Testing - Data processing,$AExpert systems )Computer science(,$AArtificial intelligence
رده
TK
7874
.
S533
1987
کتابخانه
Library and Documentation Center of Iranian Research Organization for Science and Technology
محل استقرار
استان:
Tehran
ـ شهر:
Tehran
تماس با کتابخانه :
7
-
56276326
-
021
OTHER STANDARD IDENTIFIER
Standard Number
6323
TITLE AND STATEMENT OF RESPONSIBILITY
First Statement of Responsibility
Singh, Narinder
Title Proper by Another Author
6591-
Title Proper
An artificial intelligence approach to test generation
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Boston
Name of Publisher, Distributor, etc.
Kluwer Academic Pub.
Date of Publication, Distribution, etc.
1987
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
X,193p. :ill.
SERIES
Series Title
The Kluwer international series in engineering and computer science
ISSN of Series
19
GENERAL NOTES
Text of Note
Bibliography:p.]189[-193
TOPICAL NAME USED AS SUBJECT
Entry Element
$AIntegrated circuits - Very large scale integration - Testing - Data processing
Entry Element
$AExpert systems )Computer science(
Entry Element
$AArtificial intelligence
DEWEY DECIMAL CLASSIFICATION
Number
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK
7874
.
S533
1987
PERSONAL NAME - PRIMARY RESPONSIBILITY
Entry Element
by Narinder Singh
TI
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