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ورود / ثبت نام
عنوان
An artificial intelligence approach to test generation
پدید آورنده
by Narinder Singh
موضوع
Integrated circuits - Very large scale integration - Testing - Data processing,Expert systems (computer science),Artificial intelligence
رده
TK
,
7874
,.
S533
,
1987
کتابخانه
Central Library and Document Center of Shahid Madani University of Azarbayjan
محل استقرار
استان:
East Azarbaijan
ـ شهر:
Tabriz
تماس با کتابخانه :
34327567
-
041
English Book
TITLE AND STATEMENT OF RESPONSIBILITY
Title Proper
An artificial intelligence approach to test generation
First Statement of Responsibility
by Narinder Singh
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Boston
Name of Publisher, Distributor, etc.
Kluwer Academic
Date of Publication, Distribution, etc.
1987
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
x, 193 P.; 25c.m
INTERNAL BIBLIOGRAPHIES/INDEXES NOTE
Text of Note
Bibliography: P. 189
TOPICAL NAME USED AS SUBJECT
Entry Element
Integrated circuits - Very large scale integration - Testing - Data processing
Entry Element
Expert systems (computer science)
Entry Element
Artificial intelligence
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK
,
7874
,.
S533
,
1987
PERSONAL NAME - PRIMARY RESPONSIBILITY
Entry Element
Singh, Narinder 1956
PERSONAL NAME - SECONDARY RESPONSIBILITY
Entry Element
Title
Entry Element
Series
Proposal/Bug Report
×
Proposal/Bug Report
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