عنوان
پدید آورنده
موضوع
رده
{1648},fe823984b80082dc2d17ebe2cd118be2
{
1648
},
fe823984b80082dc2d17ebe2cd118be2
کتابخانه
محل استقرار
English Book
TITLE AND STATEMENT OF RESPONSIBILITY
Title Proper
Microelectronic failure analysis: Instrumentation, science, materials and applications
First Statement of Responsibility
prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Materials Park, OH
Name of Publisher, Distributor, etc.
ASM International
Date of Publication, Distribution, etc.
2001
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
v,171 p.ill: ill
SUMMARY OR ABSTRACT
Text of Note
Includes bibliographical references and index
TOPICAL NAME USED AS SUBJECT
Entry Element
Electronics--Materials--Testing--Handbooks, manuals, etc
Entry Element
Microelectronics--Materials--Testing--Handbooks, manuals, etc
Entry Element
Microelectronics--Materials--Defects--Handbooks, manuals, etc
Entry Element
Electronic apparatus and appliances--Testing--Handbooks, manuals, etc
Entry Element
Semiconductors--Defects--Handbooks, manuals, etc
