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ورود / ثبت نام
عنوان
LSI/VLSI testability design
پدید آورنده
Frank F. Tsui
موضوع
Integrated circuits-- Large scale integration-- Testing,Integrated circuits-- Very large scale integration-- Testing
رده
TK
،
7874
،.
T78
،
1987
کتابخانه
Central Library and Information Center of Shahed University
محل استقرار
استان:
Tehran
ـ شهر:
Tehran
تماس با کتابخانه :
51214110
-
021
English Book
TITLE AND STATEMENT OF RESPONSIBILITY
Title Proper
LSI/VLSI testability design
First Statement of Responsibility
Frank F. Tsui
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
New York
Name of Publisher, Distributor, etc.
McGraw-Hill
Date of Publication, Distribution, etc.
1987
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
xv, 702 p. : ill. ; 24 cm
INTERNAL BIBLIOGRAPHIES/INDEXES NOTE
Text of Note
Includes index
Text of Note
Bibliography: p. 591-684
TOPICAL NAME USED AS SUBJECT
Entry Element
Integrated circuits-- Large scale integration-- Testing
Entry Element
Integrated circuits-- Very large scale integration-- Testing
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK
Book number
7874
Classification Record Number
.
T78
1987
PERSONAL NAME - PRIMARY RESPONSIBILITY
Entry Element
Tsui Frank F
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