1. Kelvin probe force microscopy :
المؤلف: Sascha Sadewasser, Thilo Glatzel, editors.
المکتبة: کتابخانه مطالعات اسلامی به زبان های اروپایی (قم)
موضوع: Atomic force microscopy.,Electrostatics-- Measurement.,Scanning probe microscopy.,Materials science.,Materials science.,Measurement.,Mensuration & systems of measurement.,Microscopy.,Nanotechnology.,Physical measurements.,Physics.,Precision instruments manufacture.,SCIENCE-- General.,Spectrum analysis, spectrochemistry, mass spectrometry.,Spectrum analysis.,Surfaces (Technology),Testing of materials.,Thin films.
رده :
QH212
.
A78
K45
2018
2. Kelvin probe force microscopy : measuring and compensating electrostatic forces
المؤلف: Sascha Sadewasser, Thilo Glatzel, editors
المکتبة: (طهران)
موضوع: ، Atomic force microscopy,Measurement ، Electrostatics
رده :
QH
212
.
A78K4
