عنوان
پدید آورنده
موضوع
رده
TK 7874 .D4749 1989
TK
7874
.
D4749
1989
کتابخانه
محل استقرار
Design & test techniques for VLSI & WSI circuits
London, U.K.
P. Peregrinus on behalf of the Institution of Electrical Engineers
c1989
vi, 315 p. :ill. ;24 cm
IEE computing series ; 51
Includes bibliographical references and index.
edited by R.E. Massara
1
، Integrated circuits- Very large scale integration- Design and construction
، Integrated circuits- Very large scale integration- Testing
، Integrated circuits- Wafer- scale integration- Design and construction
، Integrated circuits- Wafer- scale integration- Testing
621
.
381/5
TK
7874
.
D4749
1989
NO
TI
AU Massara, R. E., 1947-
CO Institution of Electrical Engineers.
TI Design and test techniques for VLSI & WSI circuits.
