عنوان

IDDQ testing of VLSI circuits

0792393155

11003

انگلیسی

IDDQ testing of VLSI circuits

[Book]

/ edited by Ravi K. Gulati and Charles F. Hawkins

Boston

: Kluwer Academic Publishers

, 1993

120 p.

: ill.

; 27 cm

Frontiers in electronic testing

English

A Special issue of Journal of electronic testing: theory and applications

Reprinted from Journal of electronic testing: theory and applications, vol. 3, no. 4

DDQ is subscript in IDDQ in title; testing method also known as quiescent current testing

Includes bibliographical references and index

Integrated circuits - Very large scale integration - Testing

Metal oxide semiconductors, Complementary - Testing

Iddq testing

7874

I3223

1993

Gulati, Ravi K.

Hawkins, Charles F.

Iran

University of Tehran. Library of Technical Camp 2

Old cataloging