عنوان
پدید آورنده
موضوع
رده
QC 176.83 .B57 2006
QC
176
.
83
.
B57
2006
کتابخانه
محل استقرار
IR
40721
انگلیسی
IR
Thin film analysis by X-Ray scattering
[Book]
/ Mario Birkhols with contributions by Paul F. Fewster, Christoph Genzel
Weinheim
: Wiley - VCH
, 2006
XXII, 356 p.
: ill
; 25 cm
English
Includes bibliographical references and index.
Thin films
X-ray spectroscopy
QC
176
.
83
.
B57
2006
Birkholz, Mario, author
Fewster, Paul F
Genzel, Christoph
ایران
University of Tehran. Library of Technical Camp 1
Old cataloging
p
BL
1
Y
