عنوان
پدید آورنده
موضوع
رده
TK 7874 .S533
TK
7874
.
S533
کتابخانه
محل استقرار
0898381851
IR
28348
انگلیسی
IR
An artificial intelligence approach to test generation
[Book]
/ by Narinder Singh
Boston
: Academic Press
, 1987
x, 193 p.
: ill.
; 25 cm
The Kluwer international series in engineering and computer science, SECS 19
English
P: (189)-193
Integrated circuits - Very large scale integration - Testing - Data processing
Expert systems (Computer science)
Artificial intelligence
TK
7874
.
S533
Singh, Narinder, 1956-, author
ایران
University of Tehran. Library of Technical Camp 1
Old cataloging
p
BL
1
Y
