عنوان
پدید آورنده
موضوع
رده
QA,276,.N45,2004
QA
,
276
,.
N45
,
2004
کتابخانه
محل استقرار
0471697362
IR
ebook13203
انگلیسی
IR
Accelerated testing
[Electronic Resource]
:statistical models, test plans and data analyses
/ Wayne Nelson
Pbk. ed.
Hoboken, N.J.
: Wiley-Interscience,
, c2004.
xiv, 601 p.
: ill. ; 25 cm.
(Wiley series in probability and statistics)
(Wiley-Interscience paperback series)
(Wiley classics library)
e
Includes bibliographical references (p. 561-577) and index.
Wiley series in probability and statistics
Wiley-Interscience paperback series
Wiley classics library
Failure time data analysis.
Reliability (Engineering)--Statistical methods
Accelerated life testing--Statistical methods
QA
,
276
,.
N45
,
2004
Nelson, Wayne, 1936
ایران
QA,276,.N45,2004
0471697362.pdf
0
old catalog
e
BL
1
a
Y
