عنوان
پدید آورنده
موضوع
رده
TK,7895,.E42,S978,2008eb
TK
,
7895
,.
E42
,
S978
,
2008eb
کتابخانه
محل استقرار
alk. paper)
9780123739735 (hardcover
IR
ebook31711
انگلیسی
IR
System-on-chip test architecture
[Electronic Resource]
:nanometer design for testability
/ edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba
Amsterdam ;Boston
: Morgan Kaufmann Publishers,
, c2008.
xxxvi, 856 p.
: ill.
(The Morgan Kaufmann series in systems on silicon)
e
Includes bibliographical references and index.
Morgan Kaufmann series in systems on silicon
Systems on a chip--Testing
Integrated circuits--Very large scale integration--Testing
Integrated circuits--Very large scale integration--Design
621
.
39
,
5
TK
,
7895
,.
E42
,
S978
,
2008eb
Wang, Laung-Terng
Stroud, Charles E
Touba, Nur A
ebrary, Inc
ایران
621.39,5
9780123739735.pdf
0
old catalog
e
BL
1
a
Y
