عنوان
پدید آورنده
موضوع
رده
TK,7874,.T4323,2011
TK
,
7874
,.
T4323
,
2011
کتابخانه
محل استقرار
(hbk.)
9781441982964
IR
ebook43649
انگلیسی
IR
Test and diagnosis for small-delay defects
[Electronic Resource]
/ Mohammad Tehranipoor, Ke Peng and Krishnendu Chakrabarty
New York ;London
: Springer,
, 2011.
xviii, 212 p.
: ill. (some col.) ; 24 cm.
e
Includes bibliographical references.
Integrated circuits--Very large scale integration--Defects
Integrated circuits--Very large scale integration--Testing
Delay faults (Semiconductors)
TK
,
7874
,.
T4323
,
2011
Tehranipoor, Mohammad H., 1974
Peng, Ke
Chakrabarty, Krishnendu
ایران
TK,7874,.T4323,2011
9781441982964.pdf
0
old catalog
e
BL
1
a
Y
