عنوان
پدید آورنده
موضوع
رده
TK 7874 .M3443 1991
TK
7874
.
M3443
1991
کتابخانه
محل استقرار
1-55899-119-0
IR
78119
انگلیسی
IR
Materals reliability issues in microelectronics
[Book]
: symposium held April 30 - may 3, 1991, Anaheim, California, U. S. A.
editors: James R. Lioyd, Frederick G. Yost, Paul S. Ho
Pittsburgh, Pennsylvania
: Materials Research Society
, 1991
xiii, [360] p.
: fig.
; 23 cm
Material Research Society
; v.225
انگليسي
Includes bibliographical references and index
Microelectronics -- Reliability -- Congresses
Microelectronics -- Materials -- Testing -- Congresses
Electrodiffusion -- Congtesses
Microstructure -- Congresses
TK
7874
.
M3443
1991
Lloyd
Ho
, James R
, Paul S
Materials Research Society
MRS Symposium on Materials reliability Issues in Microelectronics
: 1991
(1st
: Anaheim, Calif.)
Iran
Central Library Of Tehran University
Old cataloging
BL
1
Y
