عنوان
پدید آورنده
موضوع
رده
TS 173 .K63 2012
TS
173
.
K63
2012
کتابخانه
محل استقرار
English
Accelerated reliability and durability testing technology
Hoboken, N. J.
Wiley
c2012
xviii, 411 p.: ill.; 25 cm
Wiley series in systems engineering and management
Includes bibliographical references )p. 393-405( and index
Lev M. Klyatis
1
، Reliability )Engineering(
، Accelerated life testing
620/
.
00452
TS
173
.
K63
2012
Klyatis, Lev M.
AU
TI
SE
