عنوان
پدید آورنده
موضوع
رده
TK 7874 .H8 1998
TK
7874
.
H8
1998
کتابخانه
محل استقرار
English
VLSI testing : digital and mixed analogoue /digital techniques
London
The institution of electrical engineers
c1998
xx,532 p. : ill. ; 25 cm
IEE circuits devies and systems series
9
Includes bibliographies
Stanley L. Hurst
1
Testing ، Integrated circuits - Very large scale integration
TK
7874
.
H8
1998
CA
Hurst, S. L.
AU
SE
TI
