عنوان
پدید آورنده
موضوع
رده
621 .39732 I11P 1997
621
.
39732
I11P
1997
کتابخانه
محل استقرار
254814
انگلیسی
IR
Proceedings: International Workshop on Memory Technology, Design, and Testing
[book]
/ edited by F. Lombardi, R. Rajsuman, and T. Wik; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI; in cooperation with IEEE Solid State Circuits Council
Los Alamitos, Calif.
: IEEE Computer Society Press
، 1997
ix, 103 p.
:ill.
Includes bibliographical references and index
Semiconductor storage devices
Random access memory
-- Testing Congresses
-- Congresses
621
.
39732
I11P
1997
TK7895
.
M4I334
1997
Lombardi, Fabrizio
1955-
Rajsuman, Rochit
Wik, Thomas
، 1955-
creator
creator
creator
IEEE International Workshop on Memory Technology, Design, and Testing (1997: San Jose, Calif.)
IEEE Computer Society. Test Technology Technical Committee
IEEE Computer Society. Technical Committee on VLSI
author
ایران
TK7895.M4I334 1997
Previous cataloging
BL
1
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