9781461434368
IR
EN-38605
انگلیسی
IR
Atom Probe Microscopy
[Book]
/ Baptiste Gault, Michael P. Moody, Julie M. Cairney, Simon P. Ringer
Springer
, 2012.
Electronic
TESTING&ENGINEERING, CIVIL|ENGINEERING, MULTIDISCIPLINARY|MATERIALS SCIENCE, CHARACTERIZATION
E-BOOK
Baptiste Gault
ایران
Atom Probe Microscopy
محرمانه
محرمانه
278164.pdf
متن
old catalog
e
BL
1
a
Y
