9783642401275
IR
EN-59748
انگلیسی
IR
Ellipsometry of functional organic surfaces and films
[Book]
/ Karsten Hinrichs, Klaus-Jochen Eichhorn, editors
Berlin
: Springer,
, 2014.
(Springer series in surface sciences
; v.52)
Electronic
Includes bibliographical references and index..
Summary: Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.
Springer series in surface sciences
v.52
Ellipsometry
Physics
Surface and Interface Science, Thin Films
Surfaces and Interfaces, Thin Films
Physical Chemistry
Optics, Optoelectronics, Plasmonics and Optical Devices
Characterization and Evaluation of Materials
E-BOOK
Hinrichs, Karsten
Eichhorn, Klaus-Jochen
ایران
9783642401275.pdf
عادی
عادی
9783642401275.pdf
متن
old catalog
e
BL
1
a
Y
