9780387292
0387292608
0387292616
9780387292
IR
EN-51196
انگلیسی
IR
Fundamentals of nanoscale film analysis
[Book]
/ Terry L. Alford, Leonard C. Feldman and James W. Mayer
New York, N.Y. ; London
: Springer,
, c2007.
xiv, 336 p. ill. 25 cm.
Electronic
ng
Includes bibliographical references and index.
Thin films
Nanostructured materials
E-BOOK
Alford, Terry L.
Feldman, Leonard C
Mayer, James W.,1930-
ایران
0387292608.pdf
عادی
عادی
0387292608.pdf
0
متن
old catalog
e
BL
1
a
Y
