9780387292601
IR
E-96
انگلیسی
IR
Fundamentals of nanoscale film analysis
[Book]
/ Terry L. Alford, Leonard C. Feldman and James W. Mayer
New York, N.Y. ;London
: Springer,
, 2007.
xiv, 336 p. , ill. , 25 cm.
Electronic
Includes bibliographical references and index.
Thin films
Nanostructured materials
QC176
.
83
.
A44
2007
Alford, Terry L.
Feldman, Leonard C
Mayer, James W.,1930-
ایران
E-96
عادی
عادی
E-96.PDF
4938401
مختارزاده
9780387292601-M.jpg
متن
0
E-96
انگلیسی
old catalog
e
BL
1
a
Y
