9781420066937(e-book : pdf)
IR
E-9169
انگلیسی
IR
Measurement and modeling of silicon heterostructure devices
[Book]
/ edited by John D. Cressler
Boca Raton, FL
: CRC Press,
, c2008.
200 p.
: ill.
Print - Electronic
Includes bibliographical references and index.
Bipolar transistors--Mathematical models
Bipolar transistors.
Heterostructures.
Integrated circuits--Design and construction
Cressler, John D
ایران
Measurement and modeling of silicon heterostructure devices
عادی
عادی
E-9169.pdf
0
ایمانی
متن
0
E-9169
انگلیسی
old catalog
pe
BL
1
a
Y
