9789400777804
IR
EN-57547
انگلیسی
IR
Stochastic process variation in deep-submicron CMOS
[Book]
:circuits and algorithms
/ Amir Zjajo
Dordrecht
: Springer,
, 2014.
(Springer series in advanced microelectronics
; v.48)
Electronic
Includes bibliographical references and index..
Summary: One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key device parameters affecting performance of integrated circuits. The growth of variability can be attributed to multiple factors, including the difficulty of manufacturing control, the emergence of new systematic variation-generating mechanisms, and most importantly, the increase in atomic-scale randomness, where device operation must be described as a stochastic process. In addition to wide-sense stationary stochastic device variability and temperature variation, existence of non-stationary stochastic electrical noise associated with fundamental processes in integrated-circuit devices represents an elementary limit on the performance of electronic circuits. In an attempt to address these issues, Stochastic Process Variation in Deep-Submicron CMOS: Circuits and Algorithms offers unique combination of mathematical treatment of random process variation, electrical noise and temperature and necessary circuit realizations for on-chip monitoring and performance calibration. The associated problems are addressed at various abstraction levels, i.e. circuit level, architecture level and system level. It therefore provides a broad view on the various solutions that have to be used and their possible combination in very effective complementary techniques for both analog/mixed-signal and digital circuits. The feasibility of the described algorithms and built-in circuitry has been verified by measurements from the silicon prototypes fabricated in standard 90 nm and 65 nm CMOS technology.
Random Process Variation in Deep-Submicron CMOS -- Electronic Noise in Deep-Submicron CMOS -- Temperature Effects in Deep-Submicron CMOS -- Circuit Solutions -- Conclusions and Recommendations.
Springer series in advanced microelectronics
v.48
Metal oxide semiconductors, Complementary, Mathematical models
Stochastic processes
Physics
Electronic Circuits and Devices
Circuits and Systems
Statistical Physics, Dynamical Systems and Complexity
Appl.Mathematics/Computational Methods of Engineering
Physiological, Cellular and Medical Topics
TECHNOLOGY & ENGINEERING / Mechanical, bisacsh
E-BOOK
Zjajo, Amir
ایران
9789400777804.pdf
عادی
عادی
9789400777804.pdf
متن
old catalog
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