9783319005324
IR
EN-57497
انگلیسی
IR
Trace-based post-silicon validation for VLSI circuits
[Book]
/ by Xiao Liu, Qiang Xu
Cham ;New York
: Springer,
, cop. 2014.
(Lecture notes in electrical engineering
; v.252)
Electronic
Includes bibliographical references and index..
Lecture notes in electrical engineering
v.252
Integrated circuits, Very large scale integration, Design and construction
Integrated circuits, Verification
COMPUTERS / Logic Design, bisacsh
TECHNOLOGY & ENGINEERING / Electronics / Circuits / Logic, bisacsh
TECHNOLOGY & ENGINEERING / Electronics / Circuits / VLSI & ULSI, bisacsh
Integrated circuits, Verification, fast
Integrated circuits, Very large scale integration, Design and construction, fast
Engineering
Computer science
Systems engineering
Circuits and Systems
Processor Architectures
Semiconductors
E-BOOK
Liu, Xiao
Xu, Qiang
ایران
9783319005324.pdf
عادی
عادی
9783319005324.pdf
متن
old catalog
e
BL
1
a
Y
