0849339286 (alk. paper)
IR
EN-57046
انگلیسی
IR
X-ray metrology in semiconductor manufacturing
[Book]
/ D. Keith Bowen, Brian K. Tanner
Boca Raton
: CRC/Taylor & Francis,
, 2006.
279 p. , ill. , 25 cm.
Electronic
Includes bibliographical references and index.
Semiconductors , Design and construction , Quality control
Integrated circuits , Measurement
Semiconductor wafers , Inspection
X-rays , Diffraction
Fluroscopy
E-BOOK
Bowen, D. Keith (David Keith), 1940-
Tanner, B. K. (Brian Keith)
ایران
0849339286.pdf
عادی
عادی
0849339286.pdf
متن
old catalog
e
BL
1
a
Y
