9780198501893
IR
13701
انگلیسی
IR
Defect and microstructure analysis by diffraction
[Book]
/ Robert L. Snyder, Jaroslav Fiala, and Hans J. Bunge
New York
: Oxford University Press
, 1999.
xxii, 785 pages
: illustrations
; 24 cm.
(International Union of Crystallography monographs on crystallography
; 10.)
Language: انگلیسی
Print - Electronic
Includes bibliographical references and index.
Crystals--Defects--Analysis
Diffraction.
X-ray crystallography.
QD945
.
S58
1999
Snyder, R. L, 1941
Fiala, Jaroslav
Bunge, H.-J
ایران
13701
عادی
عادی
13701.pdf
34556138
مختارزاده
9780198501893.jpg
متن
0
13701
old catalog
pe
BL
1
a
Y
