087170479
IR
128
انگلیسی
IR
Microelectronics failure analysis: desk reference
[Book]
/ edited by Thomas W.Lee, Seshu V.Pabbisetty
3rd ed
Ohio
: ASM international
, 1993.
XV,404P.
:Illus, Diag
Language: انگلیسی
Print
Includes index
Electronics- Materials- Testing- Handbooks, Manuals, etc
Microelectronics- Materials- Testing- Handbooks, Manuals, etc
Microelectronics- Materials- Defects- Handbooks, Manuals, etc
Electronic apparatus and appliances- Testing- Handbooks, Manuals, etc
TK7870
.
M38
1993
Lee, Thomas W، .editor
Pabbisetty, Seshu V، .editor
ایران
old catalog
p
BL
1
a
Y
