عنوان
پدید آورنده
موضوع
رده
TK7874.58 .B69 2006
TK7874
.
58
.
B69
2006
کتابخانه
محل استقرار
0849339286
IR
EB10682
انگلیسی
IR
X-ray metrology in semiconductor manufacturing
[Electronic Resource]
/ D. Keith Bowen, Brian K. Tanner
Boca Raton
: CRC/Taylor & Francis,
, 2006.
279 p. ill. 25 cm.
e
ng
Includes bibliographical references and index.
Semiconductors- Design and construction- Quality control
Integrated circuits- Measurement
Semiconductor wafers- Inspection
X-rays- Diffraction
Fluroscopy
621
.
3815
.
2
TK7874
.
58
.
B69
2006
Bowen, D. Keith(David Keith),1940-
Tanner, B. K.(Brian Keith)
ایران
0849339286.pdf
محرمانه
محرمانه
0849339286.pdf
0
متن
old catalog
e
BL
1
a
Y
