عنوان
پدید آورنده
موضوع
رده
کتابخانه
محل استقرار
oldebook14655
eng
metric CMOS VLSI circuits-oriented testing for nano-Defect
Dordrecht :
: Springer,
, 2007.
Print
Integrated circuits ; Very large scale integration ; Defects. ; Integrated circuits ; Very large scale integration ; Testing. ; Metal oxide semiconductors, Complementary ; Defects. ; Metal oxide semiconductors, Complementary ; Testing. ;
Sachdev, Manoj. ; Pineda de Gyvez, Jos?. ; Sachdev, Manoj. ; Defect oriented testing for CMOS analog and digital circuits. ;
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