عنوان
پدید آورنده
موضوع
رده
کتابخانه
محل استقرار
oldebook1967
eng
delay defects-Test and diagnosis for small
New York ;London :
: Springer,
, 2011.
Print
Integrated circuits ; Very large scale integration ; Defects. ; Integrated circuits ; Very large scale integration ; Testing. ; Delay faults (Semiconductors) ;
; Peng, Ke. ; Chakrabarty, Krishnendu. ; -Tehranipoor, Mohammad H., ; 1974
old catalog
