Ion beam techniques for the analysis of light elements in thin films, including depth profiling/Radiotracer technology as applied to industry /Sampling, storage and sample preparation procedures for x ray fluorescence analysis of environmental materials/ Application of non-destructive testing and in-service inspection to research reactors/instrumentation for PIXE and RBS/Nuclear data for neutron therapy: status and future needs
Vienna
IAEA
1997, 2001
1 v. )various pagings(: ill
IAEA-TECDOC
1262; 950; 1263; 992
Cover title: Ion beam techniques for the analysis of light elements in thin films, including depth profiling
prepared by the International Atomic Energy Agency