عنوان
پدید آورنده
موضوع
رده
TK 7874 .J35
TK
7874
.
J35
کتابخانه
محل استقرار
Diagnostic measurements in LSI/VLSI integrated circuits production
Singapore
World Scientific
1991
xv, 356 p. : ill
Advanced series in electrical and computer engineering
vol.7
Includes bibliographical references
Andrzej Jakubowski, Wieslaw Marciniak, Henryk M. Przewlocki
1
، Integrated circuits- Large scale integration- Testing
، Integrated circuits- Very large scale integration- Testing
TK
7874
.
J35
NO
Jakubowski, Andrzej
AU
AU Marciniak, Wieslaw
AU Przewlocki, Henryk M.
TI
