عنوان
پدید آورنده
موضوع
رده
TK 7874 .I474 1993
TK
7874
.
I474
1993
کتابخانه
محل استقرار
Designing, testing, and diagnostics- join them
Altoona, PA
The conference
1993
xii, 1065 p.: ill
Includes bibliographical references and index
1
، Integrated circuits- Testing- congresses
، Electronic digital computers- Circuits- Testing-Congresses
TK
7874
.
I474
1993
NO
International Test conference )3991: Baltimore, Md.(
AU
AU IEEE Computer Society
TI
