عنوان
پدید آورنده
موضوع
رده
TK 7874 .D4749
TK
7874
.
D4749
کتابخانه
محل استقرار
Design & test techniques for VLSI & WSI circuits
London, U.K
P. Peregrinus on behalf of the Institution of Electrical Engineers
c1989
vi, 315 p. : ill. ; 24 cm
IEE computing series ; 51
Includes bibliographical references and index.
edited by R.E. Massara
1
، Integrated circuits -- Very large scale integration -- Design and construction
، Integrated circuits -- Very large scale integration -- Testing
، Integrated circuits -- Wafer-scale integration -- Design and construction
، Integrated circuits -- Wafer-scale integration -- Testing
TK
7874
.
D4749
TI
AU Massara, R. E., 1947-
AU Institution of Electrical Engineers
TI
