عنوان
پدید آورنده
موضوع
رده
TK 7871 .99 .M44 J49
TK
7871
.
99
.
M44
J49
کتابخانه
محل استقرار
Testing and reliable design of CMOS circuits
Boston
Kluwer Academic Publishers
c1990
xii, 231 p. : ill. ; 25 cm
Kluwer international series in engineering and computer science ; SECS 88. VLSI, computer architecture, and digital signal processing
Includes bibliographical references.
by Niraj K. Jha. and Sandip Kundu
1
، Metal oxide semiconductors, Complimentary -- Testing
، Metal oxide semiconductors, Complimentary -- Reliability
، Integrated circuits -- Very large scale integration -- Design and construction
TK
7871
.
99
.
M44
J49
Jha, Niraj K.
AU
AU Kundu, Sandip
TI
