عنوان
پدید آورنده
موضوع
رده
TK 7874 .S533
TK
7874
.
S533
کتابخانه
محل استقرار
An artificial intelligence approach to test generation
Boston
Kluwer Academic Publishers
c1987
x, 193 p. : ill. ; 25 cm
The Kluwer international series in engineering and computer science ; SECS 91
Bibliography: p. ]189[-193.
by Narinder Singh
1
2
، Integrated circuits -- Very large scale integration -- Testing -- Data processing
، Expert systems )Computer science(
، Artificial intelligence
TK
7874
.
S533
Singh, Narinder, 6591-
AU
TI
