عنوان
پدید آورنده
موضوع
رده
TK 7874.75 .M26 1995
TK
7874
.
75
.
M26
1995
کتابخانه
محل استقرار
CE
Manufacturing yield evaluation of VLSI/WSI systems
Los Alamitos, CA
IEEE Computer Society Press
1995
x, 437 p. : ill
Includes bibliographical references
Integrated circuits - Very large scale integration - Design and construction - Data processing
Integrated circuits - Wafer-scale integration - Design and construction - Data processing
Integrated circuits - Very large scale integration - Reliability
Integrated circuits - Wafer-scale integration - Reliability
Fault-tolerant computing
TK
7874
.
75
.
M26
1995
TI
]edited by[ Bruno Ciciani
English
